Electron Beam Ion Sources and Traps and Their Applications: 8th International Symposium Ebis/T 2000, Upton, New York, 5-8 November 2000 Krsto Prelec

ISBN: 9780735400115

Published: August 2nd 2001

Hardcover

304 pages


Description

Electron Beam Ion Sources and Traps and Their Applications: 8th International Symposium Ebis/T 2000, Upton, New York, 5-8 November 2000  by  Krsto Prelec

Electron Beam Ion Sources and Traps and Their Applications: 8th International Symposium Ebis/T 2000, Upton, New York, 5-8 November 2000 by Krsto Prelec
August 2nd 2001 | Hardcover | PDF, EPUB, FB2, DjVu, talking book, mp3, RTF | 304 pages | ISBN: 9780735400115 | 4.61 Mb

This symposium is a triennial event, held in different places around the world (next symposium will be in Japan, in 2003). The topic of the symposium is the development of electron beam ion sources and traps and their applications, so far in basicMoreThis symposium is a triennial event, held in different places around the world (next symposium will be in Japan, in 2003). The topic of the symposium is the development of electron beam ion sources and traps and their applications, so far in basic science and research, but with prospects for extending them into other areas.

Potential readers would have an interest in atomic physics and applications to accelerator physics.



Enter the sum





Related Archive Books



Related Books


Comments

Comments for "Electron Beam Ion Sources and Traps and Their Applications: 8th International Symposium Ebis/T 2000, Upton, New York, 5-8 November 2000":


przyczepkareklamowa.pl

©2013-2015 | DMCA | Contact us